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                        Recent Publications|2001-2010|2000|1999|1998|1997|1996|1995

2000

1.      Coulthard, R. Sammynaiken, S.J. Naftel, P. Zhang, and T.K. Sham. Porous silicon: A template for the preparation of nanophase metals and bimetallic aggregates Physica Status Solidi A. 2000, 182 (1) 157-162, DOI: 10.1002/1521-396X(200011)182:1<157::AID-PSSA157>3.0.CO;2-O

2.      S.J. Naftel, I. Coulthard, D.T. Jiang, T.K. Sham, B.W. Yates and K.H. Tan. The role of oxygen in the photoluminescence of porous silicon: Some recent observations Physica Status Solidi A. 2000, 182 (1) 373-378, DOI: 10.1002/1521-396X(200011)182:1<373::AID-PSSA373>3.0.CO;2-O

3.      B.W. Yates, Y.F. Hu, K.H. Tan, G. Retzlaff, R.G. Cavell, T.K. Sham, and G.M. Bancroft. First results from the Canadian SGM beamline at SRC J. Synchrotron Rad. 2000, 7, 296-300, DOI: 10.1107/S0909049500007214

4.      Coulthard, W.J. Antel, S.P. Frigo, J.W. Freeland, J. Moore, W.S. Calaway, M.J. Pellin, M. Mendelsohn, T.K. Shamn, S.J. Naftel, and A.P.J. Stampfl. Resonant Auger studies of metallic systems J. Vac. Sci. Technol., A. 2000, 18 (4) 1955-1958, DOI: 10.1116/1.582453

5.      Coulthard, W.J. Angel, J.W. Freeland, T.K. Sham, S.J. Naftel and P. Zhang. Influence of sample oxidation on the nature of optical luminescence from porous silicon Appl. Phys. Lett. 2000, 77 (4) 498-500, DOI: 10.1063/1.127023

6.      Y.F. Zhang, L.S. Liao, W.H. Chan, S.T. Lee, R. Sammynaiken, and T.K. Sham. Electronic structure of silicon nanowires: A photoemission and x-ray absorption study Phys. Rev. B. 2000, 61 (12) 8298-8305, DOI: 10.1103/PhysRevB.61.8298

7.      R.A. Holroyd, J.M. Preses, and T.K. Sham. Ion yields for tetramethylgermane exposed to X-rays near the Ge K-edge J. Phys. Chem. A. 2000, 104 (12) 2859-2864, DOI: 10.1021/jp993790b

8.      T.K. Sham, R. Sammynaiken, Y.J. Zhu, P. Zhang, I. Coulthard, and S.J. Naftel. X-ray excited optical luminescence (XEOL): a potential tool for OELD studies Thin Solid Films. 2000, 363 (1-2) 318-321, DOI: 10.1016/S0040-6090(99)01006-8

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1999

1.      Coulthard, D.T. Jiang, Y.J. Zhu, and T.K. Sham. A systematic study of synchrotron light induced luminescence from porous silicon: Implications to morphology and chemical effect dependent electronic behaviour J. Porous Mater. 1999, 7 (1-3) 165-168, DOI: 10.1023/A:1009618216802

2.      J. Sankar, T.K. Sham, and R.J. Puddephatt. Low temperature chemical vapour deposition of ruthenium and ruthenium dioxide on polymer surfaces J. Mater. Chem. 1999, 9 (10) 2439-2444, DOI: 10.1039/a902470k

3.      L.S. Liao, L.S. Hung, W.C. Chan, X.M. Ding, T.K. Sham, I. Bello, C.S. Lee, and S.T. Lee. Ion-beam-induced surface damages on tris-(8-hydroxyquinoline) aluminum Appl. Phys. Lett. 1999, 75 (11) 1619-1621, DOI: 10.1063/1.124773

4.      T.K. Sham, and I. Coulthard. Edge-jump inversion in the Si L-3,L-2-edge optical XAFS of porous silicon J. Synchrotron Rad. 1999, 6, 215-216, DOI: 10.1107/S0909049599001314

5.      Z. Zou, Y.F. Hu, T.K. Sham, H.H. Huang, G.Q. Xu, C.S. Seet, and L. Chan. XAFS studies of Al/TiNx films on Si(100) at the Al K- and L3,L2-edge J. Synchrotron Rad. 1999, 6, 524-525, DOI: 10.1107/S0909049599001247

6.      S.J. Naftel and T.K. Sham. Co L3,2-edge and multi-detection channel XAFS studies of Co-Si interactions J. Synchrotron Rad. 1999, 6, 526-528, DOI: 10.1107/S0909049599000989

7.      Y.J. Zhu, I. Coulthard, and T.K. Sham. XAFS studies of Rh nanostructures on porous silicon J. Synchrotron Rad. 1999, 6, 529-531, DOI: 10.1107/S0909049599001235

8.      Bzowski, M. Kuhn, T.K. Sham, J.A. Rodriguez, and J. Hrbek. Electronic structure of Au-Ag bimetallics: Surface alloying on Ru(001) Phys. Rev. B. 1999, 59 (20) 13379-13393, DOI: 10.1103/PhysRevB.59.13379

9.      S.J. Naftel, I. Coulthard, T.K. Sham, D.X. Xu, L. Erickson, and S.R. Das. Electronic structure of nickel silicide in subhalf-micron lines and blanket films: An x-ray absorption fine structures study at the Ni and Si L3,2 edge Appl. Phys. Lett. 1999, 74 (19) 2893-2895, DOI: 10.1063/1.124049

10.  Coulthard, and T.K. Sham. Luminescence from porous silicon: an optical X-ray absorption fine structures study at the Si L3,2-edge Solid State Commun. 1999, 110 (4) 203-208, DOI: 10.1016/S0038-1098(99)00045-9

11.  S.J. Naftel, A. Bzowski, and T.K. Sham. Study of the electronic structure of Au-V bimetallics using X-ray photoelectron spectroscopy (XPS) and X-ray absorption near-edge structure (XANES) J. Alloys Compd. 1999, 283 (1-2) 5-11, DOI: 10.1016/S0925-8388(98)00908-6

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1998

1.      Coulthard, S. Degen, Y.J. Zhu, and T.K. Sham. Gold nanoclusters reductively deposited on porous silicon: morphology and electronic structures Can. J. Chem. 1998, 76 (11) 1707-1716, DOI: 10.1139/cjc-76-11-1707

2.      R.R. Martin, T.K. Sham, G.W. Won, P. van der Heide, K.W. Jones, S.R. Song, and R. Protz. Secondary ion mass spectroscopy and synchrotron X-ray fluorescence in the study of the qualitative variation in metal content with time in tree rings Can. J. For. Res. 1998, 28 (10), 1464-1470, DOI: 10.1139/cjfr-28-10-1464

3.      M.A. Tomaz, E. Mayo, D. Lederman, E. Hallin, T.K. Sham, W.L. O'Brien, and G.R. Harp. Magnetic properties of Co/Rh (001) multilayers studied by x-ray magnetic-circular dichroism Phys. Rev. B. 1998, 58 (17) 11493-11500, DOI: 10.1103/PhysRevB.58.11493

4.      W. Drube, R. Treusch, T.K. Sham, A. Bzowski, and A.V. Soldatov. Sublifetime-resolution Ag L3-edge XANES studies of Ag-Au alloys Phys. Rev. B. 1998, 58 (11) 6871-6876, DOI: 10.1103/PhysRevB.58.6871

5.      M. Kuhn, R. Sammynaiken, and T.K. Sham. Electronic structure of Au-Ta alloys: An X-ray spectroscopy study Physica B. 1998, 252 (1-2) 114-126, DOI: 10.1016/S0921-4526(97)00773-4

6.      H.H. Hsieh, Y.K. Chang, W.F. Pong, J.Y. Pieh, P.K. Tseng, T.K. Sham, I. Coulthard, S.J. Naftel, J.F. Lee, S.C. Chung, and K.L. Tsang. Electronic structure of Ni-Cu alloys: The d-electron charge distribution Phys. Rev. B. 1998, 57 (24) 15204-15210, DOI: 10.1103/PhysRevB.57.15204

7.      M.A. Tomaz, T. Lin, G.R. Harp, E. Hallin, T.K. Sham, and W.L. O'Brien. Comparison of X-ray magnetic circular dichroism at the L and M edges of Mo, Ru, Rh, and Pd J. Vac. Sci. Technol. A. 1998, 16 (3) 1359-1363, DOI: 10.1116/1.581151

8.      Coulthard, and T.K. Sham. Morphology of porous silicon layers: image of active sites from reductive deposition of copper onto the surface Appl. Surf. Sci. 1998, 126 (3-4) 287-291, DOI: 10.1016/S0169-4332(97)00686-7

9.      T.M. Grehk, W. Drube, G. Materlik, J.E. Hansen, and T.K. Sham. Resonant L3M4,5N4,5 Auger electron spectroscopy as a probe for the local electronic structure in PdxAg1-x alloys J. Electron Spectrosc. Relat. Phenom. 1998, 88, 241-245, DOI: 10.1016/S0368-2048(97)00174-6

10.  S.J. Naftel, I. Coulthard, T.K. Sham, S.R. Das, and D.X. Xu. Structural and electronic property evolution of nickel and nickel silicide thin films on Si(100) from multicore x-ray-absorption fine-structure studies Phys. Rev. B. 1998, 57 (15) 9179-9185, DOI: 10.1103/PhysRevB.57.9179

11.  Coulthard, and T.K. Sham. Novel preparation of noble metal nanostructures utilizing porous silicon Solid State Commun. 1998, 105 (12) 751-754, DOI: 10.1016/S0038-1098(97)10229-0

12.  R.A.Holroyd, and T.K. Sham. Free ion yields for nonpolar liquids exposed to 1.6-3.5 KeV X-rays Radiat. Phys. Chem. 1998, 51 (1) 37-43, DOI: 10.1016/S0969-806X(97)00085-6

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1997

         S.J. Naftel, I. Coulthard, T.K. Sham, D.X. Xu, L. Erickson, and S.R. Das. Synchrotron radiation characterization of metal silicide thin films: some observations Thin Solid Films. 1997, 308, 580-584, DOI: 10.1016/S0040-6090(97)00492-6

         S.J. Naftel, A. Bzowski, T.K. Sham, D.X. Xu, and S.R. Das. XAFS studies of self-aligned platinum silicide thin films at the Pt M3,2 edge and the Si K-edge J. Phys. IV France. 1997, 7 (C2) 1131-1132, DOI: 10.1051/jp4:19972158

         Coulthard, A. Bzowski, T.K. Sham, S.M. Heald, and M. Kuhn. M3,2 and L3,2 XAFS of Au and Pt nanoparticles on porous silicon J. Phys. IV France. 1997, 7 (C2) 1133-1134, DOI: 10.1051/jp4:19972159

         Coulthard, T.K. Sham, M. Simard-Normandin, M. Saran, and J.D. Garret. XAFS studies of TiSi2 and CoSi2 thin films at the Ti, Co and Si K-edge J. Phys. IV France. 1997, 7 (C2) 1135-1136, DOI: 10.1051/jp4:19972160

         W. Drube, R. Treusch, T.K. Sham, A. Bzowski, and A.V. Soldatov. High resolution Ag L3-XANES studies of AuAg alloys using the electron yield of a narrow Auger channel J. Phys. IV France. 1997, 7 (C2) 353-356

         T.K. Sham, I. Coulthard, and S.J. Naftel. M3,2-edge X-ray absorption near edge structure of 5d metals J. Phys. IV France. 1997, 7 (C2) 477-479

         T.K. Sham, A. Hiraya, and M. Watanabe. High resolution Cu L-3,L-2-edge XANES studies of Cu-Au alloys J. Phys. IV France. 1997, 7 (C2) 491-492

         J.Z. Xiong, and T.K. Sham. Si core level XANES of organometallic compounds containing Si-Ge bonds: Experimental and theoretical observations J. Phys. IV France. 1997, 7 (C2) 493-494

         S.J. Naftel, T.K. Sham, V.I. Smelyansky, J.S. Tse, J.D. Garrett. Angular dependent XAFS studies of a MoSi2 single crystal J. Phys. IV France. 1997, 7 (C2) 495-496

         Coulthard, T.K. Sham, J.D. Garrett, V.I. Smelyansky, and J.S. Tse. XAFS of early 4-d transition metal silicides: 4-d metal L3,2 edge and Si K-edge studies J. Phys. IV France. 1997, 7 (C2) 497-498

         T.K. Sham, A. Hiraya, and M. Watanabe. Electronic structure of Cu-Au alloys from the Cu perspective: A Cu L3,2-edge study Phys. Rev. B. 1997, 55 (12) 7585-7592, DOI: 10.1103/PhysRevB.55.7585

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1996

         J.Z. Xiong, D.T. Jiang, C.E. Dixon, K.M. Baines, and T.K. Sham. Structure and bonding of organosilicon compounds containing silicon-silicon and silicon-germanium bonds: An X-ray absorption fine structure study Can. J. Chem. 1996, 74 (11) 2229-2239, DOI: 10.1139/v96-251

         Coulthard, and T.K. Sham. Charge redistribution in Pd-Ag alloys from a local perspective Phys. Rev. Lett. 1996, 77 (23) 4824-4827, DOI: 10.1103/PhysRevLett.77.4824

         M. Kuhn, A. Bzowski, T.K. Sham, J.A. Rodriguez, and J. Hrbek. Ru-promoted alloying of Au and Cu ultrathin films: Photoemission studies Thin Solid Films. 1996, 283 (1-2) 209-220, DOI: 10.1016/0040-6090(95)08255-7

         T.K. Sham, M.L. Shek, J. Hrbek, and D.G. Van Campen. Mn 3s multiplet splitting of pseudomorphic Mn overlayers on Ru(001) J. vac. Sci. Technol., A. 1996, 14 (4) 3199-3202, DOI: 10.1116/1.588807

         T. Murata, D.T. Jiang, T.K. Sham, X.H. Feng, and S.P. Firgo. Optical luminescence yield spectra of KCl:Tl produced by Cl K- and K K-edge excitations J. Electron Spectrosc. Relat. Phenom. 1996, 79, 155-158, DOI: 10.1016/0368-2048(96)02825-3

         Coulthard, D.T. Jiang, and T.K. sham. VUV induced luminescence from porous silicon J. Electron Spectrosc. Relat. Phenom. 1996, 79, 233-236, DOI: 10.1016/0368-2048(96)02844-7

         T.K. Sham, S.J. Naftel, and I. coulthard. M(3,2)-edge x-ray absorption near-edge structure spectroscopy: An alternative probe to the L3,2-edge near-edge structure for the unoccupied densities of d states of 5d metals J. Appl. Phys. 1996, 79 (9) 713407138, DOI: 10.1063/1.361483

         T.K. Sham, J. Hrbek, M.L. Shek, and K.T. Cheng. Cs 5p and 4d photoelectron linewidths of Cs/Ru(001): Implication for Cs-Ru interaction at the interface J. Electron Spectrosc. Relat. Phenom. 1996, 77 (1) 59-74, DOI: 10.1016/0368-2048(94)02393-X

         J.Z. Xiong, D.T. Jiang, Z.F. Liu, K.M. Baines, T.K. Sham, S.G. Urquhart, A.T. Wen, T. Tyliszczak, and A.P. Hitchcock. Si core-level excitation of hexamethyldisilane studied by synchrotron radiation and multiple-scattering X alpha calculation Chem. Phys. 1996, 203 (1) 81-92, DOI: 10.1016/0301-0104(95)00353-3

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1995

         M. Kuhn, J.A. Rodriguez, J. Hrbek, A. Bzowski, and T.K. Sham. Adsorption of Au on Ru(001): electronic perturbations and the nature of the bimetallic bond Surf. Sci. 1995, 341 (1-2) L1011-1018, DOI: 10.1016/0039-6028(95)00823-3

         Bzowski, Y.M. Yiu, and T.K. Sham. Charge redistribution in Au-metalloid intermetallics: A Au L2,3-edge x-ray-absorption study Phys. Rev. B. 1995, 51 (15) 9515-9120, DOI: 10.1103/PhysRevB.51.9515

         Bzowski, T.K. Sham, R.E. Watson, and M. Weinert. Electronic structure of Au and Ag overlayers on Ru(001): The behavior of the noble-metal d bands Phys. Rev. B. 1995, 51 (15) 9979-9984, DOI: 10.1103/PhysRevB.51.9979

         A.C. Ribes, S. Damaskinos, A.E. Dixon, G.E. Carver, C. Peng, P.M. Fauchet, T.K. Sham, and I. Coulthard. Photoluminescence imaging of porous silicon using a confocal scanning laser macroscope/microscope Appl. Phys. Lett. 1995, 66 (18) 2321-2323, DOI: 10.1063/1.113969

         T.K. Sham, and R.A. Holdroyd. Photoconductivity XAFS: some recent observations Phys. B. 1995, 208 (1-4) 212-214, DOI: 10.1016/0921-4526(94)00835-J

         D.T. Jiang, S.P. Frigo, I. Coulthard, X.H. Feng, K.H. Tan, T.K. Sham, and R.A. Rosenberg. XEOL XANES of ZnS(Cu) and porous Si Phys. B. 1995, 208 (1-4) 227-228, DOI: 10.1016/0921-4526(94)00666-J

         R. Sammynaiken, M. Kuhn, and T.K. Sham. Charge transfer in Au-Ta alloys: double resonance at the Au and Ta L2,3-edge Phys. B. 1995, 208 (1-4) 371-372, DOI: 10.1016/0921-4526(94)00854-O

         J.Z. Xiong, D.T. Jiang, Z.F. Liu, K.M. Baines, T.K. Sham, K.H. Tan, and X.H. Feng. XANES of organosilicon clusters at the Si K- and L-edge Phys. B. 1995, 208 (1-4) 451-452, DOI: 10.1016/0921-4526(94)00721-7

         T.K. Sham, M.L. Shek, M. Kuhn, and J. Brbek. XAFS of Mn multilayers on Ru(001) Phys. B. 1995, 208 (1-4) 469-470, DOI: 10.1016/0921-4526(94)00728-E

         D.T. Jiang, Z.Q. Gui, S.M. Heald, T.K. Sham, and M.J. Stillman. XAFS of silver(I) metallothionein Phys. B. 1995, 208 (1-4) 729-730, DOI: 10.1016/0921-4526(94)00797-Y

         Hiraya, M. Watanabe, and T.K. Sham. Electron and x-ray fluorescence yield measurements of the Cu L2,3-edge x-ray absorption fine structures: A comparative study Rev. Sci. Instrum. 1995, 66 (2) 1528-1530, DOI: 10.1063/1.1145899

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